[Download free ebook] CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)
·•●- Flora Li, Arokia Nathan ·•●-
| #9191624 in Books | 2005-04-19 | Original language:English | PDF # 1 | 6.14 x.56 x9.21l,1.19 | File Name: 354022680X | 232 pages
||1 of 1 people found the following review helpful.| Good book, poor Kindle transcription|By Andrew Jones|I refer to this book very frequently and find the information accurate and well written. Unfortunately the Kindle version has been very poorly transcribed, the font looks HORRIBLE, there are many spaces in the middle of words, and many strange symbols (also often in the middle of words). This makes the book very difficult to|From the Back Cover||As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image
As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that...
[PDF.aq52] CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS) Rating: 3.91 (527 Votes)
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