(Download) Optical Diagnostics for Thin Film Processing
| #4660989 in Books | 1995-10-28 | Ingredients: Example Ingredients | Original language:English | PDF # 1 | 9.29 x1.70 x6.25l,2.67 | File Name: 0123420709 | 783 pages
||0 of 0 people found the following review helpful.| Five Stars|By Luncun Wei|good||"The greatest value of Optical Diagnostics for Thin Film Processing is a comprehensive reference text. I highly recommend it to anyone who wants to seriously delve into the field of thin film optical diagnostics or wants a single source book of well-or
This volume describes the increasing role of in situ optical diagnostics in thin film processing for applications ranging from fundamental science studies to process development to control during manufacturing. The key advantage of optical diagnostics in these applications is that they are usually noninvasive and nonintrusive. Optical probes of the surface, film, wafer, and gas above the wafer are described for many processes, including plasma etching, MBE, MO...
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